Connect and Inspect with the XEO

Everyone knows the role of good old LEMO or BNC connectors for conventional UT inspections and IPEX (IX) for phased-array probe connectivity. However, despite decades of evolution in ultrasonic testing, connector development for dual PA probes, DLA, TOFD, and multi-UT probe applications has remained limited.

The instruments have evolved, but connectivity often hasn’t kept pace. As a result, splitters and adapters are still required to extend inspection capabilities, adding complexity and cost to the field kit.

With the XEO platform, this changes.

First, PA and UT connectivity remains 100% compatible with existing transducers.
Second, the mini-dock architecture unlocks the instrument's full multi-application potential without relying on expensive external accessories.

C - Dual IX 64-64 channels + 6x Lemo 00	B - Dual IX 64-64 channels
D - IX 128 channels + 8x Lemo 00	A - IX 128 channels

Modular Connectivity, Designed for the Field

XEO modules are available in four configurations, offering a wide range of possibilities:
 

• Two single-PA options
• Two dual-PA options
• Up to 8 conventional UT channels

Each module is swappable, and the instrument automatically recognizes the pin layout and configuration.

Mini-Dock offers and solves a wide range of configurations: 

IX 128 Channels
 

• All WheelProbe2 (64 or 128E) mapping configurations
• Manual weld inspections
• General-purpose inspections from 16E to 128E apertures using a single probe
• Compatible with third-party splitters

Dual IX 64–64 Channels
 

• Typical skew 90° and 270° setups for full encoded weld coverage
• Pitch-catch PA configurations (e.g. PA-CAT or DLA)
• Imaging coverage equivalent to the single PA mini-dock, excluding 128E probes

IX 128 Channels + 8× LEMO 00
 

•  Wide-aperture corrosion and thickness mapping
• Up to four TOFD pairs for thick-section inspections
• Additional spot checks using UT probes
• Combined pitch-catch or tandem UT configurations
• Advanced multi-scan inspection scenarios

Dual IX 64–64 Channels + 6× LEMO 00
 

• High-quality PA and TFM weld inspections
• Complex multi-scan setups combining PA, TFM, and TOFD
• Up to three TOFD pairs for thick welds

One Platform. Unlimited Possibilities.

XEO PA–UT mini-docks unlock an exceptional range of inspection scenarios, designed to meet the demands of today’s most complex field applications.

Say Yes to Every Job

Don’t miss an inspection opportunity because of missing connectors. XEO delivers powerful multi-scan capabilities. There are no limits what the instrument can do.

Easily combine PA, UT, TOFD, and TFM(i)™ within a single inspection setup. Configure your scans in just a few steps, position the probes in the required geometry, connect your scanner, and stay ahead of schedule.

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