When Multi‑Method UT Scanning Slows You Down

Multi‑method ultrasonic inspections sound efficient in theory, but in practice they can bring scanning speeds to a crawl.

Combine a dual‑side PA setup with two groups per probe, add TOFD and TFM, and suddenly you’re creeping along at under 10 mm/s. At that point, the “all‑in‑one” approach becomes unrealistic, forcing technicians to split the job into multiple passes just to keep the workflow moving.

But that workaround creates its own burden: swapping from PA to TOFD probes, re‑running calibrations, carefully realigning start positions, and managing multiple data files instead of one clean dataset. It’s a time‑sink that adds complexity without adding value. Imagine how much smoother inspections would be if the system could simply keep up with the demands of modern multi‑modal UT—fast enough to capture everything in a single pass without slowing the job down.

The Sonatest XEO is designed for speed! With up to 10 groups (PA alone or combinations of PA, TOFD, Conventional UT and TFM/TFMi) you would expect that this would slow us down! But not this system, with a maximum PRF of 50 kHz we guarantee high scanning speeds. Don’t be limited by the pulse rate frequency! our PRF can be set at “Quality” or “Speed” for calculated set values, or for full user control, simple select “Manual” and enter the PRF you want.

The Sonatest XEO is engineered with speed in mind. Even when running up to 10 simultaneous groups—whether that’s phased array alone or a combination of PA, TOFD, conventional UT, and TFM/TFMi—the system maintains exceptional performance. Where other instruments slow to a crawl under complex configurations, the XEO’s 50 kHz maximum PRF ensures consistently high scanning speeds, even in demanding multi‑modal setups.

Instead of letting pulse repetition frequency dictate your workflow, the XEO gives you full control. Choose Quality or Speed modes for optimized, calculated PRF values, or switch to Manual to set the exact PRF you need for the application. The result is a system that keeps pace with your inspection requirements—no bottlenecks, no forced compromises, just fast, reliable data acquisition across every method you need.

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