Advanced Technology


Today’s multielement and multi-technique instruments provide accurate images and are producing a multitude of different views of the part being inspected.

Phased Array, a technique broadly used nowadays, was made possible even in portable, battery operated instruments more than 10 years ago, powered by more capable electronics and software. Along with Phased Array, other complementary techniques like the Time of Flight Diffraction (TOFD) and the Total Focusing Method (TFM) are also used to provide a more detailed and comprehensive 3D representation of a defect and global integrity of a part.